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  Search result  Your search for [subject]Microwave plasma -- Material science returned 1 record.  
     
  Analytics Electron cyclotron resonance deposition and plasma diagnostics of a-Si:H and a-C:H films.

by Shing, Y.H.;

Subject: Plasma diagnostic -- Materials science; Microwave plasma -- Material science; Amorphous silicon -- Materials science; Amorphous carbon -- Materials science.

 
     
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