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Your search for [subject]Large returned 234 records. |
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LSI/ VLSI testability design.
by Tsui, Frank F.; New York: McGraw-Hill Book Company, 1988.
Subject: Science and technology; Integrated circuits -- Large scale integration -- Testing; Electronic equipment -- Large scale integrated circuits -- Testing.
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Statistical approach to VLSI.
Amsterdam: North-Holland, 1994.
Subject: Integrated circuits -- Very large scale integration -- Defects; Integrated circuits -- Very large scale integration -- Design and construction -- Statistical methods; Mathematical optimization.
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Modeling and simulation of high speed VLSI interconnects.
Boston: Kluwer Academic Publishers, 1994.
Subject: Integrated circuits -- Very large scale integration -- Design and construction -- Data processing; Integrated circuits -- Very large scale integration -- Mathematical models.
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Digital MOS integrated circuits.
New York: IEEE Press, 1981.
Subject: Integrated circuits -- Large scale integration; Integrated circuits -- Very large scale integration; Metal oxide semiconductors.
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Mixed analog-digital VLSI devices and technology : an introduction.
by Tsividis, Yannis; New York: McGraw-Hill, 1996.
Subject: Integrated circuits -- Very large scale integration -- Design and construction; Integrated circuits -- Very large scale integration -- Mathematical models; Mixed signal circuits.
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Mixed analog-digital VLSI devices and technology : an introduction.
by Tsividis, Yannis.; N.Y.: McGraw-Hill, 1996.
Subject: Integrated circuits -- Very large scale integration -- Design and construction; Integrated circuits -- Very large scale integration -- Mathematical models; Mixed signal circuits.
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Diagnostic measurements in LSI/VLSI integrated circuits production.
by Jakubowski, Andrzej; Singapore: World Scientific, 1991.
Subject: Integrated circuits -- Very large scale integration -- Design and construction; Integrated circuits -- Very large scale integration -- Testing.
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VLSI test principles and architectures : design for testability.
Boston: Elsevier Morgan Kaufmann Publishers, 2006.
Subject: Integrated circuits -- Very large scale integration -- Testing; Integrated circuits -- Very large scale integration -- Design.
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Large deviations techniques and applications.
by Dembo, Ami; New York: Springer, 1998.
Subject: Large deviations.
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Eva Luna _ Eva Luna. English.
by Allende, Isabel; New York: Bantam Books, 1989.
Subject: Large type books.
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