Search Results       Your search for [subject]Inherent axial resolution returned 1 record.           Characterization of semiconductor devices via spectral reflectance and two-photon optical beam-induced current microscopy. by Bautista, Godofredo S. Jr.; 2006. Subject: Physics; Semiconductor; Spectral reflectance microscopy; Inherent axial resolution.          Add to Book Cart Relevance: 30.60%