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  Search result  Your search for [subject]Electronic Inspection Board (EIB) returned 3 records.  
 
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  Analytics Lawson-Hemphil granted two U.S. patents for a new yarn apperance tester.



Subject: New yarn appearance tester; Electronic inspection board (EIB).

 
     
Relevance: 30.20%
 
     
  Analytics Measuring spun yarns by appearance.

by Richard Brakenwagen.;

Subject: Yarn measurement; Electronic Inspection Board (EIB); Spun yarns.

 
     
Relevance: 30.20%
 
     
  Analytics Lawson-Hemphill at ITMA 95.



Subject: Yarn testers; Electronic inspection board (EIB); E-cut; Breakage tester; Blend analyzer; Electronic textured yarn tester (E-TYT); Hot draw knitter (HDIL); Finish analyzer; Entanglement (DMT); Artomatic package analyzer.

 
     
Relevance: 25.60%
 
     
 
         
         
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