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Feldman, Leonard C.
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Materials analysis by ion channeling
.
by
Feldman, Leonard C.
; New York: Academic Press, 1982.
Subject:
Channeling (Physics)
;
Crystallography
;
Crystals -- Defects
;
Ion bombardment
;
Solids -- Surfaces
.
Add to Book Cart
Relevance: 14.66%
Fundamentals of surface and thin film analysis
.
by
Mayer, James W.,
; New York: North-Holland, 1986.
Subject:
Surfaces (Technology) -- Analysis
;
Thin films -- Analysis
.
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Relevance: 10.65%
Electronic thin film science : for electrical engineers and materials scientists
.
by
Tu, K. N. (King-ning), 1937-
; New York: Macmillan, 1992.
Subject:
Electric engineering -- Materials
;
Thin, films, Multilayered
.
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Relevance: 10.39%
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